Semiconductor memories technology, testing, and reliability /
Sharma, Ashok K.
Semiconductor memories technology, testing, and reliability / [electronic resource] : Ashok K. Sharma. - Piscataway, N.J. : New York : IEEE Press ; Institute of Electrical and Electronics Engineers, c1997. - xii, 462 p. : ill. ; 26 cm.
IEEE ebook "IEEE order number: PC3491"--P. [4] cover. "IEEE Solid-State Circuits Council, sponsor." IT Carlow ebook
Includes bibliographical references and index.
Electronic reproduction.
Piscataway, N.J. :
IEEE,
2010.
Mode of access: World Wide Web.
System requirements: Web browser.
Title from title screen (viewed on Mar. 15, 2010).
Access may be restricted to users at subscribing institutions.
9780470546406 0470546409
9780470546406 IEEE http://ieeexplore.ieee.org
Semiconductor storage devices.
Electronic books.
621.39732
Semiconductor memories technology, testing, and reliability / [electronic resource] : Ashok K. Sharma. - Piscataway, N.J. : New York : IEEE Press ; Institute of Electrical and Electronics Engineers, c1997. - xii, 462 p. : ill. ; 26 cm.
IEEE ebook "IEEE order number: PC3491"--P. [4] cover. "IEEE Solid-State Circuits Council, sponsor." IT Carlow ebook
Includes bibliographical references and index.
Electronic reproduction.
Piscataway, N.J. :
IEEE,
2010.
Mode of access: World Wide Web.
System requirements: Web browser.
Title from title screen (viewed on Mar. 15, 2010).
Access may be restricted to users at subscribing institutions.
9780470546406 0470546409
9780470546406 IEEE http://ieeexplore.ieee.org
Semiconductor storage devices.
Electronic books.
621.39732