Normal view MARC view ISBD view

Interferometry--surface characterization and testing : 24 July 1992, San Diego, California / Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. - Bellingham, Wash. : SPIE, c1992. - vii, 183 p. : ill. ; 28 cm. - Proceedings / SPIE--the International Society for Optical Engineering ; v. 1776 . - Proceedings of SPIE--the International Society for Optical Engineering ; v. 1776. .

Includes bibliographical references and index.

ISBN: 0819409499 9780819409492

LCCN: 92085390

Subjects--Topical Terms:
Surfaces (Technology)--Testing--Congresses
Surfaces (Technology)--Optical properties--Congresses
Interferometry--Congresses
Mathematics & science

Dewey Class. No.: 620.44