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Optically based methods for process analysis : 23-26 March 1992, Somerset, New Jersey / David S. Bomse ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, Fiber Optics Materials Research Program/Rutgers University, New Jersey Commission on Science and Technology. - Bellingham, Wash. : SPIE, c1992. - ix, 384 p. : ill. ; 28 cm. - Proceedings / SPIE--the International Society for Optical Engineering ; v. 1681 . - Proceedings of SPIE--the International Society for Optical Engineering ; v. 1681. .

Includes bibliographical references and index.

ISBN: 0819408425 (pbk.) 9780819408426

LCCN: 92081138

Subjects--Topical Terms:
Chemical process control--Congresses
Spectrum analysis--Congresses
Electronics & communications engineering
Fibre optics

Dewey Class. No.: 660.2815