Normal view MARC view ISBD view

Test and evaluation of IR detectors and arrays II : 22-23 April 1992, Orlando, Florida / Forney M. Hoke, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering. - Bellingham, Wash. : The Society, c1992. - vii, 225 p. : ill. ; 28 cm. - Proceedings / SPIE--the International Society for OpticalEngineering ; v. 1686 . - Proceedings of SPIE--the International Society for Optical Engineering ; v. 1686. .

Includes bibliographical references and index.

ISBN: 0819408514 9780819408518

LCCN: 92081477

Subjects--Topical Terms:
Infrared detectors--Testing--Congresses
Infrared array detectors--Testing--Congresses
Electronics & communications engineering
Applied optics

Dewey Class. No.: 621.362