Selected papers on ellipsometry / R.M.A. Azzam, editor.

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Material type: Text

TextSeries: SPIE milestone series ; v. MS 27Publication details: Bellingham, WA : SPIE Optical Engineering Press, c1990.Description: xxi, 707 p. : ill. ; 28 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
General Lending	Carlow Campus Library Store - Ask Library Staff	620.11295 (Browse shelf(Opens below))	1	Available		26232

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Previous	620.11230285424 BASIC stress analysis /	620.1127 Nondestructive methods for material property determination /	620.11272 X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California /	620.11295 Selected papers on ellipsometry /	620.11295 Second International Conference on Photomechanics and Speckle Metrology : speckle techniques, birefringence methods, and applications to solid mechanics : 22-26 July 1991, San Diego, California /	620.11297 Lectures on the electrical properties of materials /	620.11299 Standard stereograms for materials science /	Next

Includes bibliographical references and indexes.

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