Laser testing and reliability : 7 November 1991, San Jose, California / David L. Begley, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Material type: TextSeries: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1620.Publication details: Bellingham, Wash. : SPIE, c1992.Description: v, 104 p. : ill. ; 28 cmISBN:- 0819407585
- 9780819407580
- 621.366
Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
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Includes bibliographical references and index.
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