Polarization analysis and measurement : 19-21 July 1992, San Diego, California / Dennis H. Goldstein, Russell A. Chipman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Material type: TextSeries: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1746.Publication details: Bellingham, Wash. : SPIE, c1992.Description: ix, 413 p. : ill. ; 28 cmISBN:- 0819409197
- 9780819409195
- 535.520287
Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
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Includes bibliographical references and index.
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