Semiconductor device measurements.
Material type:
TextSeries: Measurement conceptsPublication details: Beaverton, Or. : Tekronix, 1968.Edition: 1st edDescription: 156 p. : ill. ; 23 cmSubject(s): DDC classification: - 621.381522
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Lending | Carlow Campus Library Store - Ask Library Staff | 621.381522 (Browse shelf(Opens below)) | 1 | Available | 3902 |
By John Mulvey, significant contributions by John Tomlin, Lee Miles and Ed Smith.
Errata slip inserted.
Includes index.
2.60