Laser testing and reliability : 7 November 1991, San Jose, California / David L. Begley, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 0819407585
- 9780819407580
- 621.366
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Includes bibliographical references and index.
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