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005 20201215152756.0
008 001128s2001 waua b 001 0 eng d
010 _a00067126
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020 _a0819440450
035 _a(DLC)00067126
040 _aDLC
_cDLC
_dDLC
_dStDuBDSZ
042 _apcc
050 0 _b.L397 2001
072 7 _aKNT
_2thema
072 7 _aTJFC
_2thema
072 7 _aTTB
_2thema
082 _a621.381531
100 1 _aLevinson, Harry J.
_927079
245 1 0 _aPrinciples of lithography /
_cHarry J. Levinson.
260 _aBellingham, Wash., USA :
_bSPIE Press,
_cc2001.
300 _ax, 373 p. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references and index.
505 0 _aOverview of lithography -- Optical pattern formation -- Photoresists -- Modeling and thin film effects -- Wafer steppers -- Overlay -- Masks and reticles -- Overcoming the diffraction limit -- Metrology -- The limits of optical lithography -- Lithography costs -- Alternative lithography techniques.
590 _a99.18
650 0 _aIntegrated circuits
_xDesign and construction
_94737
650 0 _aMicrolithography.
_95633
650 7 _aMedia, entertainment, information & communication industries
_2thema
_966357
650 7 _aElectronics: circuits & components
_2thema
_966358
650 7 _aApplied optics
_2thema
_931387
902 _a140901
903 _aMARS
907 _a.b10188861
_bcgen
_c-
942 _n0
998 _b1
_c030220
_dm
_ea
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_g0
999 _c17367
_d17367