000 02541cam a2200601 a 4500
001 BDZ0007179187
003 StDuBDS
005 20190531160422.0
006 m d
007 cr gn|
008 050928s2006 njua b 001 0 eng d
010 _a2005028448
020 _a9780471784067:
_c£47.50
020 _a0471784060 (cloth : alk. paper)
020 _a9780471784067 (cloth : alk. paper)
020 _a0471790281 (electronic bk.)
020 _a9780471790280 (electronic bk.)
035 _a(OCoLC)85820981
040 _aStDuBDS
_beng
_cStDuBDS
_dUk
_dStDuBDSZ
049 _aTIZA
050 0 _b.M379 2006
072 7 _aTJ
_2thema
072 7 _aTJFD
_2thema
072 7 _aTJFM
_2thema
082 _a621.38152
100 1 _aMay, Gary S.
245 1 0 _aFundamentals of semiconductor manufacturing and process control /
_cGary S. May, Costas J. Spanos.
260 _aHoboken, N.J. :
_bIEEE Wiley-Interscience,
_aChichester :
_bJohn Wiley [distributor],
_c2006.
300 _axix, 463 p. :
_bill. ;
_c25 cm.
500 _aIT Carlow ebook
500 _aIEEE ebook
504 _aIncludes bibliographical references and index.
505 0 _aIntroduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis.
650 0 _aSemiconductors
_xDesign and construction
650 0 _aIntegrated circuits
_xDesign and construction
_94737
650 0 _aProcess control
_xStatistical methods
_99581
650 7 _aElectronics & communications engineering
_2thema
650 7 _aElectronic devices & materials
_2thema
650 7 _aAutomatic control engineering
_2thema
700 1 _aSpanos, Costas J.
710 2 _aJohn Wiley & Sons.
776 1 _cOriginal
_z0471784060
_w(DLC) 2005028448
_w(OCoLC)61821738
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/ecip061/2005028448.html
856 4 0 _yRead this electronic book via the web
_uhttp://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952
856 4 1 _ySend a message to library staff if access to this online resource is unavailable
_umailto:libdesk@itcarlow.ie?subject=Resource%20unavailable
902 _a160105
907 _a.b10373676
_bnone
_c-
942 _n0
_2ddc
998 _b0
_c101125
_dm
_eh
_f-
_g0
999 _c35497
_d35497