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| 008 | 920313s1992 waua b 101 0 eng | ||
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| 072 | 7 |
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| 082 | _a621.366 | ||
| 245 | 0 | 0 |
_aLaser testing and reliability : _b7 November 1991, San Jose, California / _cDavid L. Begley, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. |
| 260 |
_aBellingham, Wash. : _bSPIE, _cc1992. |
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| 300 |
_av, 104 p. : _bill. ; _c28 cm. |
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| 490 | 1 |
_aProceedings / SPIE--the International Society for Optical Engineering ; _vv. 1620 |
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| 504 | _aIncludes bibliographical references and index. | ||
| 590 | _a0.00 | ||
| 650 | 0 |
_aSemiconductor lasers _xReliability _vCongresses _946121 |
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| 650 | 0 |
_aSemiconductor lasers _xTesting _vCongresses _946122 |
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| 650 | 7 |
_aLaser technology & holography _2thema _937538 |
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| 700 | 1 |
_aBegley, David L. _923542 |
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| 700 | 1 |
_aWang, S. C. _q(Shing Chung), _d1934- _924886 |
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| 710 | 2 |
_aSociety of Photo-optical Instrumentation Engineers. _913311 |
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| 830 | 0 |
_aProceedings of SPIE--the International Society for Optical Engineering ; _vv. 1620. _910479 |
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