000 01528cam a2200373Ja 4500
001 27373265
005 20201215151234.0
008 930421s1993 waua b 101 0 eng
010 _a92085079
020 _a0819409375 (pbk.)
040 _aDLC
_cDLC
_dOCL
049 _aTIZA
_b26998
082 _a621.364
245 0 0 _aUltraviolet technology IV :
_b20-21 July 1992, San Diego, California /
_cRobert E. Huffman, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
260 _aBellingham, Wash., USA :
_bSPIE,
_cc1993.
300 _aix, 402 p. :
_bill. ;
_c28 cm.
490 1 _aProceedings / SPIE--the International Society of Optical Engineering ;
_vv. 1764
504 _aIncludes bibliographical references and index.
590 _a0.00
650 0 _aUltraviolet radiation
_xInstruments
_vCongresses.
_946508
650 0 _aRemote sensing
_xEquipment and supplies
_vCongresses.
_946509
650 0 _aGeophysical instruments
_vCongresses.
_946510
650 0 _aUltraviolet radiation
_xIndustrial applications
_vCongresses.
_946511
700 1 _aHuffman, Robert E.,
_d1931-
_922405
710 2 _aSociety of Photo-optical Instrumentation Engineers.
_913311
740 0 1 _aUltraviolet technology 3.
740 0 1 _aUltraviolet technology three.
830 0 _aProceedings of SPIE--the International Society for Optical Engineering ;
_vv. 1764.
_910479
902 _a150908
903 _aMARS
907 _a.b10086638
_bcstor
_c-
942 _n0
998 _b1
_c010425
_dm
_ea
_f-
_g0
999 _c8602
_d8602