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| 001 | 27327621 | ||
| 005 | 20201215151506.0 | ||
| 008 | 930416s1992 waua b 101 0 eng | ||
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_aDLC _cDLC _dOCL |
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| 049 |
_aTIZA _b30331 |
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| 082 | _a535.520287 | ||
| 245 | 0 | 0 |
_aPolarization analysis and measurement : _b19-21 July 1992, San Diego, California / _cDennis H. Goldstein, Russell A. Chipman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. |
| 260 |
_aBellingham, Wash. : _bSPIE, _cc1992. |
||
| 300 |
_aix, 413 p. : _bill. ; _c28 cm. |
||
| 490 | 1 |
_aProceedings / SPIE--the International Society of Optical Engineering ; _vv. 1746 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 590 | _a0.00 | ||
| 650 | 0 |
_aPolarimetry _vCongresses _949924 |
|
| 700 | 1 |
_aGoldstein, Dennis H. _925399 |
|
| 700 | 1 |
_aChipman, Russell A. _923023 |
|
| 710 | 2 |
_aSociety of Photo-optical Instrumentation Engineers. _913311 |
|
| 830 | 0 |
_aProceedings of SPIE--the International Society for Optical Engineering ; _vv. 1746. _910479 |
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| 902 | _a150908 | ||
| 903 | _aMARS | ||
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