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_aOptical materials reliability and testing : _bbenign and adverse environments : 8-9 September 1992, Boston, Massachusetts / _cRoger A. Greenwell, Dilip K. Paul, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. |
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_aBellingham, Wash. : _bSPIE, _cc1993. |
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_axi, 338 p. : _bill. ; _c28 cm. |
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_aProceedings / SPIE--the International Society for Optical Engineering ; _vv. 1791 |
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| 504 | _aIncludes bibliographical references and index. | ||
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_aOptical fibers _xTesting _vCongresses _950169 |
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_aOptical fibers _xReliability _vCongresses _950170 |
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_aOptical materials _xFatigue _vCongresses _950171 |
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_aOptical materials _xEffect of radiation on _vCongresses _950172 |
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_aElectronics & communications engineering _2thema _950173 |
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_aApplied optics _2thema _931387 |
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_aGreenwell, Roger A. _919750 |
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_aPaul, Dilip K. _921651 |
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_aSociety of Photo-optical Instrumentation Engineers. _913311 |
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_aProceedings of SPIE--the International Society for Optical Engineering ; _vv. 1791. _910479 |
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