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| 008 | 920430s1992 waua 101 0 eng | ||
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_aOptically based methods for process analysis : _b23-26 March 1992, Somerset, New Jersey / _cDavid S. Bomse ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, Fiber Optics Materials Research Program/Rutgers University, New Jersey Commission on Science and Technology. |
| 260 |
_aBellingham, Wash. : _bSPIE, _cc1992. |
||
| 300 |
_aix, 384 p. : _bill. ; _c28 cm. |
||
| 490 | 1 |
_aProceedings / SPIE--the International Society for Optical Engineering ; _vv. 1681 |
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| 504 | _aIncludes bibliographical references and index. | ||
| 590 | _a0.00 | ||
| 650 | 0 |
_aChemical process control _vCongresses _950204 |
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| 650 | 0 |
_aSpectrum analysis _vCongresses _936131 |
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_aElectronics & communications engineering _2thema _950205 |
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| 650 | 7 |
_aFibre optics _2thema _932023 |
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| 700 | 1 |
_aBomse, David S. _928526 |
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| 710 | 2 |
_aSociety of Photo-optical Instrumentation Engineers. _913311 |
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| 710 | 2 |
_aRutgers University. _bFiber Optics Materials Research Program. _925095 |
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| 710 | 2 |
_aNew Jersey Commission on Science and Technology. _921536 |
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_aProceedings of SPIE--the International Society for Optical Engineering ; _vv. 1681. _910479 |
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