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008 920618s1992 waua b 101 0 eng
010 _a92081477
020 _a0819408514
020 _a9780819408518
040 _aDLC
_cDLC
_dOCL
049 _aTIZA
_b30458
072 7 _aTJ
_2thema
072 7 _aTTB
_2thema
082 _a621.362
245 0 0 _aTest and evaluation of IR detectors and arrays II :
_b22-23 April 1992, Orlando, Florida /
_cForney M. Hoke, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
260 _aBellingham, Wash. :
_bThe Society,
_cc1992.
300 _avii, 225 p. :
_bill. ;
_c28 cm.
490 1 _aProceedings / SPIE--the International Society for OpticalEngineering ;
_vv. 1686
504 _aIncludes bibliographical references and index.
590 _a0.00
650 0 _aInfrared detectors
_xTesting
_vCongresses
_950236
650 0 _aInfrared array detectors
_xTesting
_vCongresses
_950237
650 7 _aElectronics & communications engineering
_2thema
_950238
650 7 _aApplied optics
_2thema
_931387
700 1 _aHoke, Forney M.
_928436
710 2 _aSociety of Photo-optical Instrumentation Engineers.
_913311
830 0 _aProceedings of SPIE--the International Society for Optical Engineering ;
_vv. 1686.
_910479
902 _a150908
903 _aMARS
907 _a.b10099657
_bcstor
_c-
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998 _b1
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