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Laser testing and reliability : 7 November 1991, San Jose, California / David L. Begley, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

Contributor(s): Material type: TextTextSeries: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1620.Publication details: Bellingham, Wash. : SPIE, c1992.Description: v, 104 p. : ill. ; 28 cmISBN:
  • 0819407585
  • 9780819407580
Subject(s): DDC classification:
  • 621.366

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