gogo
Amazon cover image
Image from Amazon.com

Test and evaluation of IR detectors and arrays II : 22-23 April 1992, Orlando, Florida / Forney M. Hoke, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.

Contributor(s): Material type: TextTextSeries: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1686.Publication details: Bellingham, Wash. : The Society, c1992.Description: vii, 225 p. : ill. ; 28 cmISBN:
  • 0819408514
  • 9780819408518
Subject(s): DDC classification:
  • 621.362

Powered by Koha