Optically based methods for process analysis : 23-26 March 1992, Somerset, New Jersey / David S. Bomse ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, Fiber Optics Materials Research Program/Rutgers University, New Jersey Commission on Science and Technology.
Material type: TextSeries: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1681.Publication details: Bellingham, Wash. : SPIE, c1992.Description: ix, 384 p. : ill. ; 28 cmISBN:- 0819408425 (pbk.)
- 9780819408426
- 660.2815
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Includes bibliographical references and index.
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