Interferometry--surface characterization and testing : 24 July 1992, San Diego, California / Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Material type: TextSeries: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1776.Publication details: Bellingham, Wash. : SPIE, c1992.Description: vii, 183 p. : ill. ; 28 cmISBN:- 0819409499
- 9780819409492
- 620.44
Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
General Lending | Carlow Campus Library Store - Ask Library Staff | 620.44 (Browse shelf(Opens below)) | 1 | Available | 30419 |
Includes bibliographical references and index.
0.00