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Submicrometer metallization : the challenges, opportunities, and limitations : 23-25 September 1992, San Jose, California / Thomas Kwok, Takamaro Kikkawa, Krishna Shenai, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

Contributor(s): Material type: TextTextSeries: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1805.Publication details: Bellingham, Wash. : SPIE, c1993.Description: ix, 344 p. : ill. ; 28 cmISBN:
  • 0819410039
  • 9780819410030
Subject(s): DDC classification:
  • 621.38152
Holdings
Item type Current library Call number Copy number Status Date due Barcode
General Lending Carlow Campus Library Store - Ask Library Staff 621.38152 (Browse shelf(Opens below)) 1 Available 30464

Includes bibliographical references and index.

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